Atomic Force Microscopy in Process Engineering. Introduction by W. Richard Bowen

By W. Richard Bowen

This is the 1st booklet to compile either the elemental idea and confirmed approach engineering perform of AFM. it really is awarded in a fashion that's available and worthy to practicing engineers in addition to to people who are enhancing their AFM talents and data, and to researchers who're constructing new items and options utilizing AFM.

The publication takes a rigorous and sensible method that guarantees it truly is at once acceptable to approach engineering difficulties. basics and methods are concisely defined, whereas particular advantages for procedure engineering are sincerely outlined and illustrated. Key content material contains: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the advance of fouling resistant membranes; nanoscale pharmaceutical research; nanoengineering for mobile sensing; polymers on surfaces; micro and nanoscale rheometry.

  • Atomic strength microscopy (AFM) is a crucial software for approach engineers and scientists because it permits more advantageous methods and products
  • The basically ebook facing the idea and functional purposes of atomic strength microscopy in technique engineering
  • Provides best-practice counsel and adventure on utilizing AFM for procedure and product improvement

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Extra info for Atomic Force Microscopy in Process Engineering. Introduction to AFM for Improved Processes and Products

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29] R. Erlandsson, G. M. M. McClellamd, S. Chiang, Atomic scale friction between the muscovite mica cleavage plane and a tungsten tip, J. Chem. Phys. 89 (8) (1988) 5190–5192. M. M. McClellamd, R. Erlandsson, S. Chiang, Atomic-scale friction of a tungsten tip on a graphite surface, Phys. Rev. Lett. 59 (17) (1987) 1942–1946. [31] Y. Miyahara, T. Fujii, S. Watanabe, A. Tonoli, S. Carabelli, H. Yamada, H. Bleuler, Lead zirconate titanate cantilever for non-contact atomic force microscopy, Appl. Surf.

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Tejerina, A. Hernandez, Characterisation of nanofiltration membranes. Structural analysis by the DSP model and microscopical techniques, J. Membr. Sci. 279 (2006) 410–417. J. K. R. Lee, R. C. Y. Liu, Probing the local structure and mechanical response of nanostructures using force modulation and nanofabrication, Langmuir 21 (2005) 5422–5428. J. A. M. E. Patten, G. Liu, Measuring the size dependence of Young’s modulus using force modulation atomic force microscopy, J. Phys. Chem. A 110 (2006) 1382–1388.

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